Showing results: 2056 - 2070 of 4352 items found.
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STAr Technologies, Inc.
STAr Technologies is the distributor and system integrator for Keysight's range of semiconductor parameter analyzers and switch matrices and further provides integrated software for automatic test to enhance customers' efficiencies and cost-of-ownership of these instruments.
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ENC-SIM01 -
Plant Control and Automation Pty Ltd
This instrument is designed to simulate the function of most types of incremental encoders; it allows the engineer to fully test a control system that uses a rotary or linear shaft encoder, without the need for any mechanical movement.
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MUST System 3 -
Gen3 systems
The MUST System 3 is the latest technological evolution of the original Multicore Universal Solderability Tester (MUST) that grandfathered all modern solderability test standards. It remains the unquestioned industry benchmark for solderability testing.
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ADHOR400 -
Com-Ten Industries
The Adhor portable tester is ideal for your quality test on coating layer. It allows you to evaluate easily on the field the pull strength (commonly called adhesion) of your coating system on various substrates.
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ADHOR400R -
Com-Ten Industries
The Adhor portable tester is ideal for your quality test on coating layer. It allows you to evaluate easily on the field the pull strength (commonly called adhesion) of your coating system on various substrates.
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MUST 3 -
Gen3 Systems Limited
The MUST System 3 is the latest technological evolution of the original Multicore Universal Solderability Tester (MUST) that grandfathered all modern solderability test standards. It remains the unquestioned industry benchmark for solderability testing.
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TL2000 -
ficonTEC Service GmbH
ficonTEC’s series of testing machines is focused on automated electro-optical characterization ofsemiconductor chips. The ficonTEC TL2000 is a fully automated test and inspection system for unmountedlaser diode bars, single chips and chips on submounts.
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CS-1 -
Tinker & Rasor
The CS-1 portable Magnesium Anode Simulator is an ideal DC current source that will allow the user to see what the addition of a magnesium anode on their system will do to Pipe to Soil measurements and other C.P. tests.
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2461A VXI -
Astronics Corporation
The Astronics Test Systems 2461A is a high performance, 2-channel, universal 200 MHz counter, a functional replacement for the obsolete Racal Instruments™ 2461 and also recommended to replace the Keysight™ E1420A/B.
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SL1060A -
Keysight Technologies
The Measurement & Control Module SL1060A is a mobile measurement module for measuring voltage input ±10 V with 16 channels. The module can be used either as a stand-alone device or as extension for a Scienlab Battery Test System.
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SL1067B -
Keysight Technologies
The Measurement & Control Module SL1067B is a rack-mount measurement module for measuring voltage input ±10 V with 16 channels. The module can be used either as a stand-alone device or as extension for a Scienlab Battery Test System.
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CCS600 -
Suzhou 3ctest Electronic Co.,Ltd.
CCS600 designed as a modular system is the most intelligent solution offering exactly what people need for full-compliant immunity tests against transient, surge and voltage dips. The max voltage is up to 6kV.
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JGB Consulting, Inc.
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
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Buehler
Wilson® hardness testers include a comprehensive range of hardness testers from Rockwell®, Knoop/Vickers, and Brinell to fully automatic production systems. Our hardness testers are complemented by a range of ISO test blocks, accessories, and fixtures. Our calibration laboratory is recognized as the global leader in the production of premium ISO test blocks and indenters.
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National Technical Systems
Temperature and humidity testing determines how components, subsystems and complete systems behave in severe environments that involve elevated temperatures and high or fluctuating relative humidity. The tests can be static with constant temperature and humidity, they can involve the cycling of both, they can be temperature-humidity bias tests (where the moisture is used to induce a failure in an electrical device) or some combination of all of these.